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Professional Tester Archive
Issue 1 (v2.0)


The following articles from Issue 1 on Very Early Lifecycle Testing are available for download.

Issue 1 (January 2010)

VERY EARLY LIFECYCLE TESTING

VELT in TPI NEXT (160kB)
Barry Weston and Ben Visser examine what TPI NEXT says about VELT

VELT for web (70kB)
Edward Bishop on making something testable from nothing

ARTICLES

Towards quantitative governance (423kB)
Yann Gloaguen explores meaningful test success metrics

Improving process improvement (109kB)
Erik Van Veenendaal introduces some less well known approaches to TPI

FEATURES

Rude coarse analysis (201kB)
Tall tale, bad luck or outrage? You decide

Incident log (45kB)
A testing view of recent IT news

TEST LIBRARY (169kB)
New books of interest to testers reviewed

ENTIRE JANUARY 2010 ISSUE (1MB)


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